Horiba - presents: Characterization of Multilayer Coatings: Composition and Thickness using Multiple Techniques
Tuesday June 22 2 p.m. EDT
Glow Discharge – Optical Emission Spectroscopy (GD-OES) is a powerful technique for depth profile analysis (i.e., elemental composition of layers vs depth). It can sputter up to 150 microns depth in a matter of minutes while providing a nanometer scale in-depth resolution. Both conductive and non-conductive materials can be analyzed. New innovative patented features can measure the sputter rate in real time, immediately providing the thickness of any layer without any calibration. However, like other optical emission spectroscopic techniques, calibration is necessary to get concentrations.
Sometimes it is not easy to find suitable reference materials for this purpose (mainly for elements such as O, N, and H). By using other analytical techniques, like XRF, and elemental analyzers for C/S/O/N/H, the calibration of the depth profiles becomes easier.
In this webinar, attendees will learn:
@Philippe Hunault received his instrumentation engineering degree in France in 1979. He was involved in alpha, beta, and gamma spectroscopy at the beginning of his career, then joined Horiba Jobin Yvon in 1985 as the Glow Discharge Optical Emission Spectrometry product manager. After promoting GD-OES worldwide for 12 years, Philippe joined the Horiba team in the U.S. 17 years ago to promote the Horiba Elemental analyzers in North America.
ASM International is the world's largest association of materials-centric engineers and scientists. We are dedicated to informing, educating, and connecting the materials community to solve problems and stimulate innovation around the world.
ASM World Headquarters9639 Kinsman RoadMaterials Park, OH 44073-0002
+1 440.462.0292 (International)