Join us September 20, 2023 at 3:00 PM online for "Physical Inspection and Assurance of Electronics with Dr. Navid Asadi"
Link to Register - https://us02web.zoom.us/meeting/register/tZMvfu6rpjgqG9ztActuVAdCQ_tR0qi4Znim
In this talk we will focus on the physical inspection and assurance of electronics from the device to packaging and system level using advanced microscopy, failure analysis (FA) techniques combined with image analysis and machine learning. The most recent techniques for physical inspection and assurance are based on the tools and methodologies developed for FA in electronics. FA tools are primarily developed to detect a defect during or after fabrication process, but they have the most potential to be improved and help with detecting Trojans, extract secret keys, or reverse engineer a chip if used maliciously. Such tools include different imaging modalities such as optical microscope, scanning electron microscope (SEM), focused ion beam (FIB), photon emission microscope (PEM), X-ray microscopy (XRM), etc. and probe stations. It is worth mentioning that these methods require a very sophisticated sample preparation process to expose a targeted area for measurements. The attendees will learn briefly the working principle of such advanced microscopes and how they are used for physical inspection approaches including: reverse engineering, counterfeit detection, invasive and semi-invasive methods, etc.
Navid Asadi is an Associate Professor in the Electrical and Computer Engineering Department at the University of Florida with an affiliation to the Materials Science and Engineering department. He investigates novel techniques for IC counterfeit detection and prevention, system and chip level decomposition and security assessment, anti-reverse engineering, 3D imaging, invasive and semi-invasive physical assurance, supply chain security, etc. Dr. Asadi is director of the Security and Assurance (SCAN) lab house to more than $10M advanced imaging and characterization equipment. He also serves as the associate director of the Microelectronics Security Training (MEST) center which is a multi-million-dollar program to train and reskill professional engineers in the area of security. Dr. Asadi has received his NSF CAREER award in 2022 and several best paper awards from IEEE International Symposium on Hardware Oriented Security and Trust (HOST) and the ASME International Symposium on Flexible Automation (ISFA). He was also winner of D.E. Crow Innovation award from University of Connecticut. He is also founder and the general chair of the IEEE Physical Assurance and Inspection of Electronics (PAINE) Conference. His projects are sponsored by various government agencies and industry including but not limited to NSF, AFRL, AFOSR, ONR, SRC, Meta, Cisco, Analog Devices, etc.
Registration - https://us02web.zoom.us/meeting/register/tZMvfu6rpjgqG9ztActuVAdCQ_tR0qi4Znim
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