PRESENT A JOINT DINNER MEETING
Capabilities and Applications of the Latest in
Ion Beam and Electron Microscopy
Date: Thursday, September 15, 2016
Time: 5:30 pm Social Hour: Fellowship and Networking
6:30 pm Dinner 7:15 pm Brief Presentation from Social Sponsor, Intertek
7:30 Main Presentation
RESERVE WITH MEAL CHOICE BY NOON ON FRIDAY 9/9/16
to DaAliya@itothen.com or 616-475-0059
NOTE: Aliya regrets the inconvenience of the earlier than usual sign up deadline. Please try to get your reservations in early, especially if you require special food accommodations.
Place: Holiday Inn Downtown Grand Rapids
310 Pearl Street NW, Grand Rapids, MI 49504 ▪ (616) 235-1995
Social Sponsor: Intertek
Cost: Members and Non-members $25.00
Payment by cash or check at the door.
Students, retirees and unemployed $12.00
Speaker: Professor Martin A. Crimp, Department of
Chemical Engineering and Materials Science, Michigan State University
Menu: Your Choice of Stuffed Chicken Breast (artichokes, spinach, cheese and red pepper sauce) OR Roasted Pork Loin (with garlic and rosemary). All meals include salad, accompaniment, rolls, coffee or tea or lemonade, and cheese cake with strawberry sauce.
FEATURE PRESENTATION: Materials science is often described as the understanding and application of the relationships between processing, structure, and properties. A critical link in connecting these concepts is characterization of materials structure at the micro- and nano- scales. Historically, optical and electron microscopy have been the workhorse techniques for carrying out this microstructural characterization. With the push towards more nanostructured materials and devices, the need for higher resolutions and the capabilities to characterize over 3-D volumes has become more critical. In addition to enhanced scanning electron microscope (SEM) resolutions, now in the range of 1 nm, the ability to section, deposit, and characterize small volumes of materials using a focused ion beam (FIB) now allows a wide range of characterization and processing to be carried out at the nano- to micro- range.
The integration of the FIB columns with advanced SEMs results in flexible instruments that allow a very broad range of experiments and manufacturing at nano- to micro-scale. Specifically, these dual-column FIBs are often combined with a range of auxiliary facilities such as gas injection systems, nanomanipulators, electron backscattered diffraction (EBSD), energy dispersive x-ray spectroscopy, various detectors, and a wide variety of stages that allow even greater flexibility for advanced studies. While dual-column FIBs are best known for site-specific transmission electron microscopy (TEM) sample preparation, the ability to precisely remove and add material, as well as move small sections and components, increase the capabilities of these instruments.
This talk will begin by briefly reviewing some basic examples of the process, structure, property triangle, and will continue with the basic configuration of dual-column instruments. Then using an example of site-specific TEM sample preparation, the general functionalities of the primary components will be demonstrated. Following this a number of case studies will be presented that illustrate the flexibility of dual-column systems. Finally, potential artifacts associated with ion beam damage will be discussed.
SPEAKER BIO: MARTIN A. CRIMP received his B.S. and M.S. degrees in metallurgical engineering from Michigan Technological University in 1981 and 1984 respectively, and his Ph.D. in Materials Science Engineering from Case Western Reserve University in 1987. He carried out postdoctoral research at Oxford University from 1987-1989. In 1991 he joined the faculty at Michigan State University where he holds the rank of Professor in the Department of Chemical Engineering and Materials Science. Professor Crimp has been active in the fields of electron microscopy and deformation and fracture of metal alloys. In addition to using traditional transmission electron microscopy approaches for imaging crystal defects, he is involved in developing and applying electron channeling techniques for imaging such defects in bulk samples using scanning electron microscopy. His primary research focuses on heterogeneous deformation and damage nucleation in polycrystalline metals, but he has also studied magnetic multilayers, carbon nanotubes, and self-assembled rare-earth nanowires.
UPCOMING EVENTS - SAVE THE DATES:
Thursday, October 13, 2016 Challenges in Application and Development of Magnesium for Automotive Applications – Speaker Peter Ried of Ried and Associates
Thursday, November 10, 2016 ASMI TRUSTEE VISIT, Ellen Cerrata, Materials in Radiation and Dynamic Extremes Group at Los Alamos National Laboratory