April 2021 Virtual Technical Meeting

Abstract

Failure Analysts are often compared to Firefighters, as they are tasked with fixing emergencies, especially when failing parts involve the loss of lives along with heavy financial repercussions. Although non-destructive techniques are first in line, the combination of Scanning Electron Microscopy (SEM) with Energy Dispersive X-ray Spectroscopy (EDX) has proven its value among various fields where Materials Scientists and Engineers can access it.

Some of the questions often asked are:

• Do I need to be an expert at SEM/EDX?

• How fast can I get pointers to root causes?

• Do I have to bounce between different solutions?

• Can I have a report accurately generated?

The example above speaks for itself as initially hidden information is instantly revealed by the Chemically Guided AXIA ChemiSEM workflow putting elemental mapping first, not last, enabling Engineers and Materials Scientists to focus on their core competencies and expertise to identify FA root causes and provide corrective actions.

Speaker Biography

John Yorston has been doing scanning electron microscopy (SEM) for over twenty-five years, both in industry and in instrument sales and applications support. John is a veteran of countless SEM demonstrations and has conducted over 100 industrial new user short courses in SEM and microanalysis, including courses taught “under the ASM dome!” John has a BS in Chemistry from Fairleigh Dickinson University and has a background in high temperature crystal growth and ultra-high-pressure industrial diamond synthesis. John (Fox Delta) is accomplished NJ based competition soaring pilot and an active member of Aero Club Albatross, based at Blairstown Airport.