Scanning Electron Microscopy, September 11, 2026

In collaboration with Zeiss, ASM presents this course on basic scanning electron microscopy (SEM) operation. Learners will complete the online course prior to attending onsite training at ASM Laboratories. The online course material presents necessary theory and operating principles and imaging and analytical techniques.

Lab time will be held in small groups of 1-3 attendees in the ASM Microscopy Lab using the EVO LS15 SEM and a Bruker energy-dispersive spectrometer (EDS) for fast elemental mapping and inclusion analysis. Students are encouraged to bring their own samples.

This course is designed for new users.

Who Should Attend?

Those who want to be familiarized with basic scanning electron microscope operation

Learning Objectives

Upon completion of this course, you should be able to:

• Describe how electrons in the SEM are generated, interact with specimens, and are detected
• Understand relationships between magnification, resolution, and contrast in an electron microscope
• Operate an SEM/EDS instrument (hardware and software) to achieve optimal results
• Perform Energy Dispersive X-ray Spectroscopy (EDS) to determine the elemental composition of materials and make the SEM a qualitative and quantitative analytical tool
• Determine when and how to apply specific methods of specimen preparation, viewing, and EDS analysis for a variety of conductive and non-conductive materials
• Acquire informative electron images and EDS data that minimize artifacts and emphasize features of interest

IACET CEU's will be awarded for successful completion of the course requirements.

COURSE OUTLINE:

1. Operating Principle of SEM
2. SEM Imaging
3. Analytical Techniques (EDS)

Continuing Education Units: 1.3