Sample Prep User Group
11:30 a.m. - 1:30 p.m. EST
Moderators
- Jim Colvin, FA Instruments
- Bryan Tracy, Tesla
Presentation Link HERE
- Sample preparation plays a critical enabling role in failure analysis within the semiconductor industry. It has become imperative for failure analysts to remain abreast of new tools and techniques to address sample preparations on More-than-Moore (MTM) technologies.
- Come and participate in a lively group discussion on state-of-the-art sample preparation.
- In 2019, we had 150+ attendees with excellent audience participation. In consideration of industry wide complex form factors, we will be discussing a range of sample preparation techniques and strategies including mechanical, chemical, plasma, and laser-based workflows.
- In addition, how chosen workflows influence sample preparation with respect to mechanical, electrical, and thermal integrity, overall quality, throughput, and repeatability. Questions you may want answered only need to be asked. With a virtual room full of analysts, someone is bound to have an answer to share with the group.
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Carrie Hawk
ASM International
Community Engagement Specialist
440-338-5497
carrieh@asminternational.org------------------------------