Be sure to visit the EDFAS Library to view educational tutorial videos made available to EDFAS members by the EDFAS Education Subcommittee. The most recent videos posted are Sample Preparation for Scanning Electron Microscopy Characterization and Failure Analysis of Advanced Semiconductor Devices by Pawel Nowakowski and TEM Specimen Preparation and Failure Analysis of Advanced Semiconductor Devices by Cecile S. Bonifacio.
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Susan Sellers
Education Content Manager
Materials Park OH
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