WEBINAR TITLE: FIB-SEM Microscopy Introduction to Semicon FA and R&D
DATE/TIME: Monday, October 21, 11 am eastern
SPONSOR: TESCAN
DESCRIPTION: Join our exclusive webinar with Lukáš Hladík, TESCAN's Product Marketing Manager for Semiconductors, and discover how our FIB-SEM solutions are designed to enhance failure analysis and R&D. From advanced packaging investigations to AI-driven automation for TEM sample preparation, this session will showcase how our platforms can help your lab achieve superior precision, efficiency, and throughput.
In this webinar, attendees will learn about:
- A closer look at TESCAN's Ga and Xe FIB-SEM platforms
- How AI-driven automation is transforming TEM sample preparation
- The role of TESCAN SOLARIS X 2 in advanced packaging investigations
- In-situ nanoprobing for localized delayering of logic and memory devices
SPEAKER: Lukáš Hladík is - Product Marketing Manager, Semiconductors – TESCAN GROUP
Lukáš Hladík is a Product Marketing Manager specializing in FIB-SEM, characterization, and delayering/probing solutions for failure analysis in semiconductor R&D laboratories. He has been with TESCAN Group since 2012, starting as an application specialist for Plasma FIB-SEM platforms. His extensive experience in the global semiconductor industry is backed by a Master's degree in Physical Engineering and Nanotechnology from Brno University of Technology, Czech Republic.
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Nicole Hale
Director, Membership & Affiliates
ASM International
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