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  • 1.  Special failure symptom for power semiconductor

    Posted 01-24-2023 20:27
    Edited by Carrie Hawk 01-24-2023 20:32
    Usually the EOS pattern for the power semiconductor can be identify due to
    1. Voltage punch through on the guard ring or gate bus for the MOSFET related device,
    2. Current punch through on the active area, or
    3. Avalanche breakdown with several burnt marks and randomly distributed on the die surface,
    4. Or combine above symptoms on the die surface.
    Recently I found a special mark burnt mark on the power diode and as attached photos, it looks over current and caused silicon melt, but the melt pattern was continue running on the die surface and as attached photo. Can someone help to told why to have such kind of failure pattern? 
    Several years ago and found the video from ASM website about "IR Thermography: Running Bug Inside Power MOSFET"

    Can someone help to explain it for more detail

    Tony Chan
    Technical Fellow
    Artesyn Embedded Technologies
    Education courses

  • 2.  RE: Special failure symptom for power semiconductor

    Posted 01-26-2023 14:01
    @David Burgess might be a helpful resource. He's an active EDFAS member and content contributor at ASM.​

    Carrie Hawk
    ASM International
    Community Engagement Specialist


    Education courses