Dear members,
Following
@Douglas Hunt 's presentation during the Users Group Series last week, I want to share a solution which can probably solve most of the challenges mentioned by Doug about
in situ nano-probing and EBIC/EBAC on large or packaged samples.
We have released an adaptor for our standard
nano-probing solution, which provides space below the nanoprobers to accommodate large/tall samples.
Different elevations are available to match most sample heights, to probe cross-sections, wafers, packaged samples, etc., in your SEM or dual beam.
I am attaching a datasheet with more details, and two pictures as examples. I hope this will be helpful for the community. Feel free to get in touch or comment if you have any question.
@Douglas Hunt, would this solve your problems?
------------------------------
Guillaume Boetsch
Imina Technologies SA
www.imina.ch------------------------------