EDFAS - ISTFA - Contactless Probing and Nanoprobing User Group

 View Only

Latest Discussion Posts

  • GlobalFoundries material failure analysis group in Essex Junction, Vermont is looking for a Scanning Probe Microscopy engineer to join our team immediately. Please apply through the following link or contact me directly. Candidates with less experience ...

  • ​ Contactless Probing and Nanoprobing User Group Wednesday, January 27 11:30 a.m. - 1:30 p.m. EST Moderators Dan Bockelman, Intel Daminda Dahanayaka, GLOBALFOUNDRIES Neel Leslie, Thermo Fisher Scientific Sara Ostrowski, EAG Labs ...

  • Dear members, Following @Douglas Hunt ​ 's presentation during the Users Group Series last week, I want to share a solution which can probably solve most of the challenges mentioned by Doug about in situ nano-probing and EBIC/EBAC on large or packaged ...

Upcoming Events

Log in to see this information

Either the content you're seeking doesn't exist or it requires proper authentication before viewing.

Recent Shared Files



The Electronic Device Failure Analysis Society (EDFAS) mission is to foster education and communication in the failure analysis community working for the technology advancement and the improved performance and reliability of devices and materials for the electronics industry.