How to Easily Prepare Micro Targets for Electron Microscopy Analysis
Date and Time: November 8th 1:00-2:00 PM EDT
Speaker: Andrew Lawson, Advanced Workflow Specialist, Leica Microsystems
Preparation of micro targets within microelectronics and other materials systems presents a significant challenge, as these targets are rarely visible. This causes the pinpointing and alignment of these targets to be difficult. Preparing exactly to the target is often a very-time consuming process and the targets can very easily be missed. In addition, specimens with micro targets tend to be small and difficult to handle.
Leica Microsystems has developed tools that facilitate easy preparation of micro targets. The EM TXP offers precise in situ mechanical preparation, which uses an integrated viewing system, allowing for viewing of the prepared surface at all stages of the process. Combining this process with the EM TIC3X broad ion beam milling system allows for targets to be prepared to an excellent quality finish for high resolution electron microscopy analysis.
In this webinar, attendees will learn:
Andrew Lawson joined Leica Microsystems in 2016 and serves as an advanced workflow specialist, helping customers solve their applications problems for EM sample preparation. With a background in materials science and engineering, Andrew specializes in imaging and elemental analysis applications for materials science, semiconductor, and polymeric materials research. Prior to joining Leica, Andrew completed an M.S. degree in materials science and engineering at the University of Maryland where he focused on nanofabrication, imaging, and characterization of plasmonic materials.