Advancements and Applications for Measuring Residual Stress via X-ray DiffractionDate: May 20, 2020 2 PM (EST)
Description : X-ray diffraction (XRD) is an industry accepted method for determining residual stress in crystalline materials. This webinar is the second in a series of presentations providing current and future users with useful information on the operating fundamentals of XRD, technological advancements, and commercially available hardware, as well as examples of practical applications. Emphasis is placed on XRD for process optimization/validation and quality control.
In this webinar, attendees will learn about:
James Thomas ( @James Thomas ) received a B.S. in physics from the University of Pittsburgh and is the general manager of American Stress Technologies. He has been with the company for 11 years specializing in using magnetic Barkhausen noise for materials characterization and defect detection. His work and research with Barkhausen noise technology have been published in several industry publications including ASM International's Advanced Materials & Processes, American Institute of Physics publications, and the SAE International Journal of Materials and Manufacturing.
Wade Gubbels received his B.S. and M.S. in mechanical engineering from New Mexico State University and the University of British Columbia, respectively. His academic background focused on the development of optical methods including electronic speckle pattern interferometry and digital image correlation for shape, deformation, and surface displacement measurement. Prior to joining American Stress Technologies, he worked at Los Alamos National Laboratory performing residual stress measurements utilizing ESPI hole-drilling and neutron diffraction. Wade has been with American Stress Technologies for five years and is responsible for operations in the Western United States.Login/register here and find out more: