EDFAS User Group Series

The goal of these two hour User Groups is to provide those that are involved in these areas of technology (or even those with just a passing interest!) an opportunity to share information and discover avenues for future collaboration. It’s an open forum filled with mini-presentations, floor initiated topics, and a robust interchange of ideas. Come with your questions, complaints, suggestions, tips and tricks, and the like. Share what you know, enquire about something new, challenge the status quo. While the organizers provide an initial framework to get the discussion going, this is very much YOUR event.

Registration for all User Group Series events is FREE!

FIB User Group
Monday, January 25
11:30 a.m. - 1:30 p.m. EST

Moderators

• Steven Herschbein, Indepedent Contractor

• Michael Wong, Thermo Fisher Scientific

• Valerie Brogden, University of Oregon

REGISTER NOW

• Modern FIB tools are utilized in a wide variety of Fab, lab and FA tasks, including cross-sectioning, high resolution imaging, sample preparation for other analysis techniques such as TEM, and circuit edit.
• With the onset of novel ion species, new process gasses, evolving tool platforms, and greater availability of 3 rd party accessories, the applications landscape is constantly in flux.
• Cost of ownership, upkeep, and service/support models are a concern for many lab managers, which means questions about outsourcing are on the rise.
• 2020 was NOT a typical year, and uncertainty and disruptions to your lab operations will most likely continue into the near future. While the capabilities for effective laboratory analysis have never been greater, the pressure on tool owners is also on the rise to make the best use of what we have available.
• The goal of this two hour ISTFA special event is to provide those that are involved with FIB tools (or even those with just a passing interest!) an opportunity to share information, ask questions, and discover avenues for future collaboration.
• 2019 physical event had well over 100 of the top “Fibbers” in one room!

Sample Prep User Group
Tuesday, January 26
11:30 a.m. - 1:30 p.m. EST

Moderators

• Jim Colvin, FA Instruments
• Bryan Tracy, Tesla

• Sample preparation plays a critical enabling role in failure analysis within the semiconductor industry. It has become imperative for failure analysts to remain abreast of new tools and techniques to address sample preparations on More-than-Moore (MTM) technologies.
• Come and participate in a lively group discussion on state-of-the-art sample preparation.
• In 2019, we had 150+ attendees with excellent audience participation. In consideration of industry wide complex form factors, we will be discussing a range of sample preparation techniques and strategies including mechanical, chemical, plasma, and laser-based workflows.
• In addition, how chosen workflows influence sample preparation with respect to mechanical, electrical, and thermal integrity, overall quality, throughput, and repeatability. Questions you may want answered only need to be asked. With a virtual room full of analysts, someone is bound to have an answer to share with the group.