ASM Online Member Community

When using CVD to deposit polycrystalline diamond onto a silicon carbide base, there are instances where one must measure the deposition layer (say about 10 micron) without cross-sectioning the finished product or applying the same coating to a sample that can be destructively measured. There must be a way aerospace or automotive suppliers do this, possibly with x-ray absorbance or wavelength bounceback. 

When using CVD to deposit polycrystalline diamond onto a silicon carbide base, there are instances where one must measure the deposition layer (say about 10 micron) without cross-sectioning the finished product or applying the same coating to a sample that can be destructively measured. There must be a way aerospace or automotive suppliers do this, possibly with x-ray absorbance or wavelength bounceback. 

When using CVD to deposit polycrystalline diamond onto a silicon carbide base, there are instances where one must measure the deposition layer (say about 10 micron) without cross-sectioning the finished product or applying the same coating to a sample that can be destructively measured. There must be a way aerospace or automotive suppliers do this, possibly with x-ray absorbance or wavelength bounceback. 

When using CVD to deposit polycrystalline diamond onto a silicon carbide base, there are instances where one must measure the deposition layer (say about 10 micron) without cross-sectioning the finished product or applying the same coating to a sample that can be destructively measured. There must be a way aerospace or automotive suppliers do this, possibly with x-ray absorbance or wavelength bounceback. 

When using CVD to deposit polycrystalline diamond onto a silicon carbide base, there are instances where one must measure the deposition layer (say about 10 micron) without cross-sectioning the finished product or applying the same coating to a sample that can be destructively measured. There must be a way aerospace or automotive suppliers do this, possibly with x-ray absorbance or wavelength bounceback. 

One of our consultants sent this back to me. All we do is CVD diamond films.

You might also look at attending ICMCTF in San Diego in April.

Hope this helps.

Ed

This is pretty easy stuff. Semiconductor industry has been doing this of decades! They use ellipsometry or reflectometry to measure films down to nm thick nondestructively. Examples are below.

https://www.angstec.com/?gad_source=1&gad_campaignid=20937964969&gbraid=0AAAAAD_CVvYA-rvByCESH614tNP5Y7X9w

The 

NanoSpec is a non-contact optical metrology tool that determines the thickness of transparent thin films (e.g., oxides, photoresists) on silicon wafers by measuring light reflection. It uses spectro-reflectometry to analyze how light waves interfere within the film, typically operating across the 370–800nm range to calculate thicknesses from 100 Å to 

. 

I used to measure thickness on Nanospec in 1985!

When using CVD to deposit polycrystalline diamond onto a silicon carbide base, there are instances where one must measure the deposition layer (say about 10 micron) without cross-sectioning the finished product or applying the same coating to a sample that can be destructively measured. There must be a way aerospace or automotive suppliers do this, possibly with x-ray absorbance or wavelength bounceback. 

When using CVD to deposit polycrystalline diamond onto a silicon carbide base, there are instances where one must measure the deposition layer (say about 10 micron) without cross-sectioning the finished product or applying the same coating to a sample that can be destructively measured. There must be a way aerospace or automotive suppliers do this, possibly with x-ray absorbance or wavelength bounceback. 

When using CVD to deposit polycrystalline diamond onto a silicon carbide base, there are instances where one must measure the deposition layer (say about 10 micron) without cross-sectioning the finished product or applying the same coating to a sample that can be destructively measured. There must be a way aerospace or automotive suppliers do this, possibly with x-ray absorbance or wavelength bounceback.